I am a Staff Engineer at Samsung Electronics AI Center, where I work on semiconductor data intelligence and layout pattern generation. My research focuses on practical machine learning systems that remain reliable under limited supervision, noisy labels, and imperfect industrial data pipelines.
Before joining Samsung Electronics, I completed my M.S. and Ph.D. in Integrated Technology at Yonsei University, advised by Prof. Hyunjung Shim. I also interned at NAVER AI Lab with Song Park, Byeongho Heo, and Dongyoon Han. My earlier research centered on weak supervision, semantic segmentation, localization, and representation learning. More recently, I have been working on semiconductor data modeling, generative methods, and robust preprocessing for industrial AI systems.
My current interests include label-efficient learning, robust industrial vision systems, and semiconductor layout generation.
(* indicates equal contribution; † indicates corresponding author.)
Blind to Position, Biased in Language: Probing Mid-Layer Representational Bias in Vision-Language Encoders for Zero-Shot Language-Grounded Spatial Understanding
NM An*, I Kang*, M Lee, H Shim†
European Conference on Computer Vision (ECCV), 2026
MaskRIS: Semantic Distortion-aware Data Augmentation for Referring Image Segmentation
M Lee*, S Lee*, S Park, D Han, B Heo†, H Shim†
Transactions on Machine Learning Research (TMLR), 2025
Fine-Grained Image-Text Correspondence with Cost Aggregation for Open-Vocabulary Part Segmentation
J Choi*, S Lee*, M Lee, S Lee, H Shim†
Conference on Computer Vision and Pattern Recognition (CVPR), 2025
Understanding Multi-Granularity for Open-Vocabulary Part Segmentation
J Choi*, S Lee*, S Lee, M Lee, H Shim†
Neural Information Processing Systems (NeurIPS), 2024
SeiT++: Masked Token Modeling Improves Storage-efficient Training
M Lee*, S Park*, B Heo, D Han, H Shim†
European Conference on Computer Vision (ECCV), 2024
Saliency as pseudo-pixel supervision for weakly and semi-supervised semantic segmentation
M Lee*, S Lee*, J Lee, H Shim†
IEEE Transactions on Pattern Analysis and Machine Intelligence (PAMI), 2023
Hybridmatch: Semi-supervised facial landmark detection via hybrid heatmap representations
S Kang*, M Lee*, M Kim, H Shim†
IEEE Access 11, 26125-26135, 2023
Threshold matters in wsss: Manipulating the activation for the robust and accurate segmentation model against thresholds
M Lee*, D Kim*, H Shim†
Conference on Computer Vision and Pattern Recognition (CVPR), 2022
Railroad is not a train: Saliency as pseudo-pixel supervision for weakly supervised semantic segmentation
S Lee*, M Lee*, J Lee, H Shim†
Conference on Computer Vision and Pattern Recognition (CVPR), 2021
Psynet: Self-supervised approach to object localization using point symmetric transformation
K Baek*, M Lee*, H Shim†
AAAI Conference on Artificial Intelligence, 2020
Rethinking Weakly Supervised Semantic Segmentation Utilizing Both Point and Image Labels
M Lee, H Lee, H Shim†
Available at SSRN 5062471, 0
Weakly supervised semantic segmentation device and method based on pseudo-masks
H Shim, S Lee, M Lee
US Patent No. 11,798,171, granted October 24, 2023. JP Patent App. 2021-207591. Korean Patent App. 10-2021-0124495.